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Increased interference fringe visibility from the post fabrication heat treatment of a perfect crystal silicon neutron interferometer

机译:从制造后的热量增加干涉条纹可见性   处理完美的晶体硅中子干涉仪

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摘要

Construction of silicon neutron interferometers requires a perfect crystalsilicon ingot (5 cm to 30 cm long) be machined such that Bragg diffracting"blades" protrude from a common base. Leaving the interferometer bladesconnected to the same base preserves Bragg plane alignment, but if theinterferometer contains crystallographic misalignments of greater than about 10nrad between the blades, interference fringe visibility begins to suffer.Additionally, the parallelism, thickness, and distance between the blades mustbe machined to micron tolerances. Traditionally, interferometers do not exhibitusable interference fringe visibility until 30 $\mu$m to 60 $\mu$m of machiningsurface damage is chemically etched away. However, if too much material isremoved, the uneven etch rates across the interferometer cause the shape of thecrystal blades to be outside of the required tolerances. As a result, theultimate interference fringe visibility varies widely among neutroninterferometers that are created under similar conditions. We find thatannealing a previously etched interferometer at $800^\circ \mathrm{C}$dramatically increased interference fringe visibility from 23 % to 90 %. TheBragg plane misalignments were also measured before and after annealing usingneutron rocking curve interference peaks, showing that Bragg plane alignmentwas improved across the interferometer after annealing. This suggests thatcurrent interferometers with low fringe visibility may be salvageable and thatannealing may become an important step in the fabrication process of futureneutron interferometers, leading to less need for chemical etching and larger,more exotic neutron interferometers.
机译:硅中子干涉仪的构造需要加工出完美的晶体硅锭(5厘米至30厘米长),以使布拉格衍射“刀片”从共同的底部突出。将干涉仪刀片连接到同一基座可以保持布拉格平面对准,但是如果干涉仪刀片之间的晶体学对准偏差大于10nrad,则干涉条纹的可见度开始受到损害。此外,必须加工刀片之间的平行度,厚度和距离微米公差。传统上,直到用化学方法蚀刻掉30微米至60微米的加工表面损伤后,干涉仪才会显示出有用的干涉条纹可见性。然而,如果去除了太多的材料,则整个干涉仪上不均匀的蚀刻速率会导致晶体叶片的形状超出所需的公差。结果,在类似条件下产生的中子干涉仪之间,最终的干涉条纹可见度差异很大。我们发现,将先前蚀刻的干涉仪以$ 800 ^ \ circ \ mathrm {C} $进行退火,可使干涉条纹的可见度从23%急剧增加到90%。还使用中子摇摆曲线干涉峰测量了退火前后的布拉格平面失准,这表明在退火之后,整个干涉仪的布拉格平面取向得到了改善。这表明具有低边缘可见性的当前干涉仪可能是可挽救的,并且退火可能成为未来中子干涉仪制造过程中的重要步骤,从而导致对化学蚀刻的需求减少,并且更大,更奇特的中子干涉仪。

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